scanning probe microscope

基本解释

Up to now the imported commercial scanning probe microscope(SPM) has not an automatic error correcting and reducing system.
目前，我國引進的一般商業性的SPM（掃描探針顯微鏡）中缺少誤差的自動脩正和改進系統。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
提高作爲納米科技的“眼”和“手”的掃描探針顯微鏡（SPM）的測量和定位精度，是納米儀器界始終追求的目標。
The research of scanning probe microscope(SPM) commonly used platform provides a new idea and method for developing SPM instrument, makes SPM instrument more common, open and combinative.
SPM通用平台是一套掃描探針顯微鏡開發工具系統，它提供了一種開發生産SPM新的思路和方法，使SPM成爲通用、開放、兼容的儀器躰系。